Smart Measuring Instruments for Cyber-Physical Systems

: pp. 7 - 15
Mykola Mykyychuk, Svyatoslav Yatsyshyn, Bohdan Stadnyk, Yaroslav Lutsyk.

Aiming the substantial development of CyberPhysical systems, which are becoming a key element of everyday life, the smart measuring instruments are considered below as the indispensable part of entire systems. Verification of the metrological subsystems for parameters determining the controlled equipment and processes through the development, implementation and realization of specific metrology and standardization methods, instruments, that is successfully described by the terms “metrological hardware, software, and middleware”

  1. A. Platzer. Carnegie Mellon University. Logical Foundations of Cyber-Physical Systems.
  2. C. Mathas, Smart Sensors - Not Only Intelligent, but Adaptable, Contributed By Electronic Products, 2011-09-29.
  3. S. Y. Yurish, Sensors: Smart vs. Intelligent, Sensors & Transducers, Vol. 114, Issue 3, March 2010, pp. 1-6.
  4. B. Deb, S. Bhatnagar, B. Nath. A Topology Discovery Algorithm for Sensor Networks with Applications to Network Management, CiteSeerX, 2002,
  5. Wayne W. Manges, Oak Ridge National Laboratory.
  6. Ad-hoc Sensor Networks electronic-computer-engineering/research-activities/wncc/ad-hoc-sensor-networks
  7. Sensor technology handbook, Editor-in-Chief Jon S. Wilson, SA, 2005.
  9. What is smart grid sensor? - Definition from
  10. Change into UA. Start-up in energetics.
  11. H. Salem, M. Nader, Middleware: Middleware Challenges and Approaches for Wireless Sensor Networks, IEEE DISTRIBUTED SYSTEMS ONLINE 1541-4922, Published by the IEEE Computer Society, Vol. 7, No. 3; March 2006.
  12. "What is Middleware?". Defining Technology. 2008. Retrieved 2013-08-11.
  13. S. Hadim, N. Mohamed, 2006). Middleware challenges and approaches for wireless sensor networks. IEEE Distributed Systems Online, vol 7. Issue 3. 2006, Retrieved March 4, 2009 from IEEE Distributed Systems.
  14. M. Kazahaya, A Mathematical Model and Error Analysis of Coriolis Mass Flowmeters, IEEE Transactions on Instrum. and Measurement, Vol. 60, Issue 4, 2011, Р. 1163-1174.
  15. D. Spitzer, The Consumer Guide to Coriolis Mass Flowmeters, Seminar. Spitzer and Boyes, LLC, 2004.
  16. The procedure for certification of software of measuring instruments. Access to information::
  17. WELMEC 7.1, Edition 2 Information document. Development of software requirements. Vienna, 2005, 48 p.
  18. MI 3286 - 2010. Testing of software protection, with the determination of its level at the measuring instruments tests in order to type approval, Moscow, 2010, 33 pp. (in Russian).
  19. Microsoft Secure Software Development, The 3-rd Conference on minimization of software vulnerabilities in its development,
  20. What is CSSLP (certified secure software lifecycle.
  21. ISSECO, the International Secure Software Engineering Council.
  22. Обобщеннаямодельпроцедурыиспытанийизмерительногопрограммногообеспечения / Г. В. Злыгостева, С. В. Муравьев // ИзвестияТомскогополитехн. ун-та. 2011. Т. 318. No 4, С. 62-67.
  23. Метрология, качествоисертификацияпрограммногообеспечения / Е. В. Ковалевская. - М., 2004. - 96 с.
  24. O. Oleskiv, I. Kunets. I. Mykytyn, Review of Techniques and Methods of Software Verification of Metrological Means, Lviv, 2014, Publishing House of Lviv Politechnic, No. 75, 2014,
  25. S. Yatsyshyn, B. Stadnyk, Ya. Lutsyk, L. Buniak. Handbook of Thermometry and Nanothermometry, IFSA Publishing, Spane, 2015.
  26. Measurement Science Roadmap for Metal-Based Additive Manufacturing, May 2013, sponsored by NIST.
  27. S. Ko, H. Pan, C. Grigoropoulos, et al. All-inkjet-printed flexible electronics fabrication on a polymer substrate by low-temperature high-resolution selective laser sintering of metal nanoparticles, IOP Publishing, Nanotechnology, Vol. 18, 2007, 345202, 8 pp.,
  28. Concept Laser Introduces QA Tool for In Process AM: QMmeltpool 3D Available Next Year, July 2, 2015.
  29. B. Stadnyk, E. Manske, A. Khoma, State and prospects of computerized systems monitoring the topology of surfaces, based on white light interferometry, Computational Problems of Electrical Engineering, Vol. 4, No. 1, 2014, pp. 75-80.