Neural networks have proved their value as hypothesis generators in the cycle of different objects designing. In this article the approach of using self-organizing Kohonen map in the problems of thermal designing of microelectronic devices for determination of the search direction of thermo-physical and design parameters, and for elaboration on their bases of standard solutions for providing normal temperature condition of microelectronic device functioning, has been suggested.
1. Fedasyuk D., Levus Ye., Yaroshchuk N., Petrov D. The mechanism of the relational database architecture for the microelectronic components thermal design in the Internet // Proceedings of International Conference MIXDES`2005. – 2005. – Krakow, Poland. P.261–266. 2.Чорна Н.Я., Левус Є.В., Федасюк Д.В. Забезпечення заданого теплового режиму в мікроелектронних пристроях з використанням нейромережевих технологій / “Комп’ютерні системи проектування” Вісник Нац. унів. “Львівська політехніка”. – 2005. – №.548. – С.38–43. 3. Bilas O., Levus Ye., Yakovyna V. Selforganising map as a tool of modelling the design parameters of microelectronics devices for ensuring the specified temperature condition / Proceedings of the International Conference on Computer Science and Information Technologies. – Lviv, Ukraine. – 2006. – P. 74–76. 4. Hopfield J.J., Tank D.W. Neural computation of decision in optimization problems // Biol. Cybernet., 1985. V. 52. P. 141–152. 5. Levus Ye., Fedasyuk D. Mathematical Model of the Thermal Gradients in the Flip-Chip Structure // Proceedings of the VIIIth International Conference CADSM`2005. – 2005. – Lviv-Polyana. – P.289–292. 6. Levus Ye., Bilas O. Self-organizing neural networks as instrumental tools for thermal design of microelectronic devices // Second Intern. Conf. “Computer Science and Information Technologies (CSIT’2007)”: Proc. – Lviv, 2007. – P.104–105. 7. Федасюк Д.В., Левус Е.В., Петров Д.В. Конструктивные методы обеспечения тепловых режимов в кристаллах ИС, установленных на жесткие выводы // Информационные технологии в проектировании и производстве. – 2002. – №2. – C.51–57.