Suppression of interface impedance contrast in plane-parallel coatings

2015;
pp. 3 – 10
Authors: 
Kosoboutskyy P., Karkulovska M.

Department of Computer-Aided Design (CAD)

Department of Physics (DP)

Lviv Polytechnic National University

The paper focuses on the study of spectral and angular conditions for interface antireflection by means of impedance contrast suppression, applying the method of theoretical and computer analysis of the envelope functions of spectra of multibeam interference. The research is conducted in the resonance dispersion region of dielectric constant of the single and binary boundaries that form a plane-parallel structure. The analytical relations between the Brewster/Pseudo-Brewster angles and structure parameters are.

1. Born M, Wolf E. Principles of Optics. Moscow: Nauka 1973. 2. Macleod H.A. Thin film optical filters. Bristol: Hilger 1986. 3. Thelen À. Design of optical interference coatings. New York: McGraw-Hill 1989. 4. Furman Sh. A, Tikhonravov A. V. Basics of optics of multilayer systems. Gif-sur-Yvette: Editions Frontiers 1992. 5. Bennet J. M. Polarization. In Handbook of Optics. Sponsored by the Optical Society of America. Michael Bass, editor in chief. – 2nd ed. McGraw: Hill. Inc. 1995; p. 5.1–5.28. 6. Willey R. Practical Design and Production of Optical Thin Films. Crc.Press 2002. 7. Kaiser N, Pulker H. K. Optical Interference Coatings. Berlin: SpringerVerlag 2003. 8. Al-Dilami Ahmed A., Vrublevsky I. A, Chernyakova K. V., Pykhir G. A. Absorption of energy of electromagnetic radiation in interference in sulated structures with nanoporous alumina // Scient & Tecn PFMT 2014; 2(19): 96–9. 9. Micheli D., Apollo C., Pastore R. and et al. Electromagnetic characterization of composite materials and microwave absorbing modeling. In: Reddy B editor. Materials Science: Composite Materials. Advances in Nanocomposites – Synthesis, Characterization and Industrial Applications. ISBN 978-953-307-165-7, Published: April 19, 2011 under CC BY-NC-SA 3.0 license. 10. Linkov L. M. et al. New materials for screens of electromagnetic radiation. Doklady BGUIR 2004, 3: 152–167. 11. Baskakov A. N. et al. Resonance effects full interference absorption of wave energy in the subtle that weakly absorb layers // Letters to J of Technical Physics1976, 2(19): 891–3. 12. Kozar A. V. Distribution of electric field intensity in multilayer systems of resonant type. In: Kozar A. V., Kolesnikov W. S., Pirogov Y. A. Editors. Bulletin of Moscow state University, Physics and astronomy 1978, 9(1): 78–86. 13. Sokolovskyy I., Pokrovsky Yu. Applied radiooptics. Theory and methods the resonant angular filtering. – Kiev: Naukova Dumka, 1986. 14. Schopper H. Zur Optik dünner doppelbrechender und dichroitischer Schichten // Zeitsschrift fur Physik 1952, 132(2): 146–70. 15. Brewster D. On the laws which regulate the polarisation of light by reflexion // Philos Trans 1815, 105: 125–30. 16. Bass M editor. Handbook of Optics (2). 2nd ed. New York: McGraw-Hill 1995. 17. Kosobutsky P. S. Inversion of a nonmonotonic polarizationalangular dependence of light reflection coefficient from a thin film on an absorbing substrate // J Appl Spectr 2005; 72(2): 277–9. 18. Abeles F. Methods for determining optіcal parameters of thin films. In: Wolf E editor. Progress in Optics (2). Amsterdam: North Holland 1963; p. 429–88. 19. Martinez-Anton J. Simultaneous determination of film thickness and refractive index by interferential spectrogoniometry // Opt Commun 1966; 132(3–4): 321–8. 20. Dyankov G. Modified channeled spectrum for fast measurement of thin films // Appl Opt 2008; 47(4): 536–47. 21. Kosobutskyy P. S. Envelope method of Fabry-Perot spectra interferometry. Lviv: Lvivska Polytechnika 2013. 22. Kosoboutskyy P. S. Physics bases for modeling the electromagnetic wave processes in optics / Kosoboutskyy P. S., Karkulovska M. S., Seheda M. S. – Lviv: Lvivska Polytechnika, 2003. 23. Kosoboutskyy P. S. Extrema envelope function multibeam interference Fabry-Perot / Kosoboutskyy P. S., Karkulovska M. S. – Part I. Properties and applied aspects for plane-parallel single-layer systems // Radioelectronics & Informatics J 2012, 4:90–4. 24. Humphrey S. Direct calculation of the optical constants for a thin film using a midpoint envelope // Appl Opt 2007; 46: 4660-6.