Inner Structure

Hidden defects can turn into obvious defects and characteristics of electronic elements become inappropriate. Therefore, the techniques of non-destructive diagnostics of inner structure state are of great importance. One of these techniques is the diagnostics of electronics by their own noise, which advantageously differs by low time consuming and absence of the risk of damage of the element under investigation. Noise measurements are capable to detect the defects in a material with a sensitivity that cannot be reached by other methods.