Atomic-force microscopy

Research of volt-ampere characteristics of the wire Pierce electron gun under electron-beam microprocessing of dielectrics

The article considers the basic energy characteristics of a wire Pierce electron-beam gun, which used for microprocessing of dielectric materials in vacuo. The aim of the work is to determine the optimal regimes of electron-beam microprocessing of dielectric materials by studying the volt-ampere characteristics of the wire Pierce electron-beam gun.

Perspectives of Method Atomic Force Microscopy for Research and State Physical and Mechanical Characteristics Precision Machinery Surface Products

This paper is the well-proven expediency of the use of method of atomic-force microscopy is at research of the state and superficial descriptions of surfaces of wares of precision engineer. Basic directions of researches of topogram, physics and mechanics descriptions of surfaces of wares of precision engineer and set limitations and defects are considered in using of its method for research of separate properties of surfaces of wares.