The Fourier integral transform has been used to reduce the diffraction problem of the normal SH-wave on a semi- infinite rigid inclusion in the elastic layer to the Wiener-Hopf equation. Its solution is obtained by the factorization method. The analytical expressions of the diffracted displacement fields have been represented in any region of interest. The dependences of the scattered field on the parameters of the structure have
The purpose of this paper is to model the displacement field on the layer’s surfaces with an internal defect for its further identification. For this purpose, the problem of SH-wave diffraction from the defect located in the elastic layer is solved. The defect is modelled by the rigid semi- infinite inclusion of zero thickness. Time factor is assumed to been given. The properties of identification of the inclusion type defect in the plane layer have been illustrated.
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