1. JCPEE
  2. All Volumes and Issues
  3. Volume 6, Number 1, 2016
  4. Models describing the degradation of functional parameters of electronic devices based on the weibull-gnedenko distribution

Models describing the degradation of functional parameters of electronic devices based on the weibull-gnedenko distribution

JCPEE.
2016;
Volume 6, Number 1
: pp.1-8
Authors:
  1. Sergei Borovikov
  2. Evgeni Shneiderov
  3. Irina Burak
1
Belarusian State University of Informatics and Radioelectronics
2
Belarusian State University of Informatics and Radioelectronics
3
Belarusian State University of Informatics and Radioelectronics

The authors offer the possibility for obtaining the mathematical model of degradation of a functional parameter in the form of conditional density of its distribution over a given operating time period on the basis of the 3-parametric Weibull-Gnedenko distribution. This model provides reliability prediction errors for samples of electronic devices smaller, than the errors after using the degradation model based on normal distribution of the functional parameter.

Degradation model of parameter
reliability prediction of electronic devices
semicon¬ductor devices
experiment for reliability prediction
  1. D. Coit, J. Evans, N. Vogt, J. Thomson, “A Method for Correlating Field Life Degradation with Reliability Prediction for Electronic Modules”, Quality and Reliability Engineering International, vol. 21, issue 7, pp. 715-726, 29 September 2005.
  2. S. Borovikov, Statistical Forecasting for the Rejection of Potentially Unreliable Electronic Devices. Moscow, Russia, 2013.
  3. S. Borovikov, A. Shalak, A. Beresnevich, A. Emelyanov, “Physical-statistical models of degradation of functional parameters of electronic devices”, Reports of The National Academy of Sciences of Belarus, vol. 51, no. 6, pp.105-109, 2007.
  4. S. Borovikov, A. Shalak, A. Beresnevich, A. Emelyanov, E. Shneiderov, “Reliability Forecasting of electronic devces on the basis of a mathematical model of degradation of functional parameter”, Reports of Belarusian State University of Informatics and Radioelectronics: electronics, materials, technology, informatics, vol. 6, pp. 3239, 2008.
  5. E.S. Ventcel, Probability Theory. Moscow, Russia, 1969.
  6. S. Borovikov, E. Shneiderov, I. Burak, “Models based on the Weibull-Gnedenko distribution for describe the degradation of the functional parameters of electronic devices”, Reports of The National Academy of Sciences of Belarus, vol. 59, no. 3, pp.109-115, 2015.
  7. R. Vadzinky, Handbook of Probability Distri­butions. St. Petersburg, Russia, 2001
  8. U. Miller, Physical Bases of Integrated Circuits Reliability. Moscow, USSR: Sovietskoye Radio, 1976.
  9. QuickLogic Reliability Report. рASIC, Vialink and QuickLogic Corp., 1998.
  10. Reliability Audit Report 1999. Life Test Data. ON Semiconductor L.L.C., Formerly a Division of Motorola, 1999.