DEPENDENCE OF DISPERSION OF MEASUREMENT RESULTS ON DURATION OF MEASUREMENT
The results of statistical measurements of the resistance of the metal film resistor are given below. The analysis of the dependencies of the standard deviation on the number of measurements σR(N)envisages a tendency of raising σR with the number of measurements. It indicates that the obtained results are not independent since fluctuations of them are not of “white” noise type. The dependence of the standard deviation of measurement results onN confirms the results of other studies.