Fermi level.

SENSITIVE ELEMENTS OF TEMPERATURE CONVERTERS BASED ON HfNi1-xCuxSn THERMOMETRICAL MATERIAL

The results of experimental studies of sensitive elements of temperature transducers based on semiconductor
thermometric material HfNi1-xCuxSn are presented. Thermometric materials HfNi1-xCuxSn, x=0.01–0.10, were produced by fusing a
charge of components in an electric arc furnace with a tungsten electrode (cathode) in an atmosphere of purified argon under a
pressure of 0.1 kPa on a copper water-cooled base (anode). Heat treatment of the alloys consisted of homogenizing annealing at a

CHARACTERISTICS OF THERMOMETRIC MATERIAL Lu1-xScxNiSb

The results of modeling the properties of the semiconductor solid solution Lu1-xScxNiSb, x=0–0.10, which is a promising thermometric material for the manufacture of sensitive elements of thermocouples, are presented. Modeling of the electronic structure of Lu1-xScxNiSb was performed by the Korringa-Kohn-Rostoker (KKR) method in the approximation of coherent potential and local density and by the full-potential method of linearized plane waves (FLAPW).

STUDIES OF THERMOMETRIC MATERIAL Lu1-xZrxNiSb

The results of experimental research of perspective thermometric material Lu1-xZrxNiSbwhich can be used for the production of sensitive elements of thermoelectric and electroresistive thermometers are presented. Thermometric materials Lu1-xZrxNiSb, x=0.01–0.10, were made by fusing a charge of components in an electric arc furnace with a tungsten electrode (cathode) in an atmosphere of purified argon under a pressure of 0.1 kPa on a copper water-cooled hearth (anode). Heat treatment of alloys consisted of homogenizing annealing at a temperature of 1073 K.

STUDY OF THERMOMETRIC MATERIAL Er1-xScxNiSb. II. EXPERIMENTAL RESULTS

The results of a comprehensive study of the crystal and electronic structures, kinetic and energetic performances of the semiconductor thermometric material Er1-xScxNiSb, (x=0–0.1) are presented. Microprobe analysis of the concentration of atoms on the surface of Er1-xScxNiSb samples established their correspondence to the initial compositions of the charge, and the diffractograms of the samples are indexed in the structural type of MgAgAs.

RESEARCH OF THERMOMETRIC MATERIAL Er1-xScxNiSb. I. MODELLING OF PERFORMANCES

Automated The results of modeling performances of the semiconductor solid solution Er1-xScxNiSb are presented, which can be a promising thermometric material for the manufacture of sensitive elements of thermoelectric and electroresistive thermocouples. Fullprof Suite software was used to model the crystallographic characteristics of the Er1-xScxNiSb thermometric material.