ANALYSIS OF THE STABILITY OF A CMOS TEMPERATURE SENSOR UNDER TEMPERATURE AND POWER-SUPPLY VARIATIONS
The paper considers the problem of stability of CMOS temperature sensors under variations in temperature and supply voltage. A critical analysis of existing methods (SPICE modeling, PTAT/CTAT models, Monte Carlo analysis, calibration, and statistical approaches) is performed, and their limitations are identified, in particular, insufficient consideration of nonlinear effects, noise, and the multifactorial influence of external conditions.