Standard deviation

This article presents results related to the direct solution of the polynomial regression parameters based on the analytical solving of regression equations. The analytical solution is based on the normalization of the values of independent quantity with equidistance steps. The proposed solution does not need to directly solve a system of polynomial regression equations. The direct expressions to calculate estimators of regression coefficients, their standard deviations, and also standard and expanded deviation of polynomial functions are given.

The  article proposes  an  approach  to  the  research of  the metrological  reliability  of measurements  taking  into account the conditions and operating modes of measuring equipment, based on the intermediate control of the standard deviation of  the measurement  results.  The  above  approach  is  relevant  because  it  allows  laboratories  to  reasonably  set  the  recalibration intervals  of  measuring  equipment  based  on  the  control  of  standard  deviations.  The  requirement  for  reasonable  setting  of recalibration intervals for measuring instruments is a common worldwide

The results of statistical measurements of the resistance of the metal film resistor are given below. The analysis of the dependencies of the standard deviation on the number of measurements σR(N)envisages a tendency of  raising σR with the number of measurements. It indicates that the obtained results are not independent since fluctuations of them are not of “white” noise type. The dependence of the standard deviation of measurement results onN confirms the results of other studies.