The journal "Measurement Techniques and Metrology", founded at the National University "Lviv Polytechnic" in 1965, is characterized by a rich history. Since 1991, with the acquisition of independence by Ukraine, it has been published in Ukrainian. Strengthening international cooperation has led to the appearance of articles published in English. At the same time, the development of nanotechnologies and work under the auspices of European programs has led to the spread of interdisciplinary research, which was best suited to the profile of the journal - an interdepartmental scientific and technical collection. This is evidenced by the publication of a thorough monograph "Handbook of Thermometry and Nanothermometry"https://sensorsportal.com/thermometry.html, the author of which is the unchanged Main editor since 1982, and Honorary since 2018, the editor of the journal - the head of the Department of Information and Measurement Technologies, Prof. B. Stadnik. Works appear, the authors of which are scientists from different countries. This process is intensifying with the 4th industrial revolution in Europe – Industry 4.0. Scientists of the Department of Information and Measurement Technologies of Lviv Polytechnic, who form the core of the Editorial Board of the journal, intellectualize their own research. Keeping pace with the Metrology 4.0 program, in 2016 the monograph “Cyber-Physical Systems. Metrological Issues”https://www.sensorsportal.com/DOWNLOADS/Books/Cyber-Physical_Systems.pdf, 2016 was published; and in 2021 the monograph “Cyber-Physical Systems and Metrology 4.0” https://www.sensorsportal.com/HTML/BOOKSTORE/Cyber-physical_systems_and_Metrology_4_0.pdf (both edited by Prof. B. Stadnik and Prof. S. Yatsyshyn).
In the near future, the realization of the potential of Cyber-Physical Systems, based on constantly updated data from measuring instruments, may face the problem of the need for specialists who possess an extremely wide range of knowledge: from cybernetics and systems theory to programming with computer engineering and metrology. And this is a topic that is covered by journal sections. For its better study, new laboratories are being opened at the Department of ICT: a) from National Instruments, USA based on the LabVIEW graphical platform, designed to significantly simplify the formation and implementation of unique virtual and ad hoc tools, including measurements, by quickly visualizing data samples; b) from Cypress Semiconductor Corp., USA for the study, design and implementation of microcontrollers for various branches of science and technology; c) from IFM Electronic, Germany for the research, programming and use of smart sensors; d) from SIOS, Germany – for the use of laser interferometers for the study of nanoscopic deformation processes in bodies, their vibrations, etc.
Publications of scientific works in these areas have become the main "vectors" of the development of "Measurement Technologies and Metrology" over the past few years. After all, these are precisely the areas of scientific research whose results have recently been used in modern technologies. For example, long-term research and development of quantum standards in the world revealed a gap, which consists in the absence of a Quantum Temperature Standard - the last unquantized quantity of the SI system. So, we have done an excellent job and proposed this unique device as the main pillar of a new quantum thermometry, the basics of which were published in "Measurement Technology and Metrology", No. 77, 2017, pp. 40-49.
In addition, our scientists and teachers, who successfully change their scientific interests in line with scientific progress, have the opportunity to participate not only in the transfer of technology to industry, but also in further development of technologies. They constantly raise the level of the journal based on the results of applied scientific research. You can witness this in the membership of the editorial board of the journal, where, in addition to professors of Lviv Polytechnic and a number of educational institutions of Ukraine, Germany, Poland, prominent managers of leading IT companies in the world are represented. Pay attention to the following feature. Individual works are grouped into volumes in such a way as to achieve the main goal of each bulletin, which is to publish high-quality scientific knowledge as quickly as possible. The sections of our journal, related to the initial structural levels of Cyber-Physical Systems, describe the various stages of obtaining and further processing of primary information necessary for their effective operation. It is metrology that determines the algorithms of microcontrollers, which ensure the accuracy and reliability of the operation of complex control systems in various areas of human activity.
Editorial Board