The problem of the elastic SH-wave diffraction from the semi-infinite interface defect in the rigid junction of the elastic layer and the half-space is solved. The defect is modeled by the impedance surface. The solution is obtained by the Wiener- Hopf method. The dependences of the scattered field on the structure parameters are presented in analytical form. Verifica¬tion of the obtained solution is presented.
The Fourier integral transform has been used to reduce the diffraction problem of the normal SH-wave on a semi- infinite rigid inclusion in the elastic layer to the Wiener-Hopf equation. Its solution is obtained by the factorization method. The analytical expressions of the diffracted displacement fields have been represented in any region of interest. The dependences of the scattered field on the parameters of the structure have
A mathematical model of the influence of major factors on the resolution of space imaging systems is presented. The dependence of modulation transfer function by the factors affecting on image quality and the natural conditions of imaging is determined.
The quantitative theory of diffraction by azimuthally ordered circular nanotubes of any chemical composition is offered. The pseudoorthogonality effect, earlier found out experimentally, is considered. The obtained results are compared with X-ray diffraction patterns of oriented preparations of chrysotile nanotubes.