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  4. SH-Wave Scattering From the Interface Defect

SH-Wave Scattering From the Interface Defect

ACPS.
2020;
Випуск 5, Номер 1
: pp. 45 - 50
https://doi.org/10.23939/acps2020.01.045
Автори:
  1. Myron Voytko
  2. Yaroslav Kulynych
  3. Dozyslav Kuryliak
1
Karpenko Physico-Mechanical Institute of the NAS of Ukraine
2
Karpenko Physico-Mechanical Institute of the NAS of Ukraine
3
Karpenko Physico-Mechanical Institute of the NAS of Ukraine

The problem of the elastic SH-wave diffraction from the semi-infinite interface defect in the rigid junction of the elastic layer and the half-space is solved. The defect is modeled by the impedance surface. The solution is obtained by the Wiener- Hopf method. The dependences of the scattered field on the structure parameters are presented in analytical form. Verifica¬tion of the obtained solution is presented.

Elastic layer
імпеданс
rigid junction
дефект
дифракція
normal wave
Wiener-Hopf technique
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