This article is devoted to the substantiation of the possibility of electrical capacitance measurement utilizing equations that are based on the approximation of scattering ellipse, formed by signals proportional to the current flowing through the capacitive tested object and voltage drop on the tested object.
The major error of temperature measurements of different objects is due to uncertainty of their emissivity factor value. And vice versa, for correct determination of a true temperature, using conventional temperature means (pyrometers, thermal image cameras), one has to know in advance the emissivity factor of the studied object’s surface or better to set its value in place immediately before a measurement. The latter is proposed by authors to significantly increase the accuracy of temperature measurement.
The article focuses on the main problems of methodology of the measurement quality evaluation in the context of introduction into metrological practice of the International Dictionary of Metrology VIM 3. The generalized definition of the notion of measurement quality is given. A separate analysis of measurement quality indexes as a process and quality indexes of measurement result as a product of this process is carried out.