In micro- and nanotechnology, the demands placed on measurement technology are increasing. The structures to be measured are becoming more complex with smaller structure widths, increasingly larger surface regions, and thousands of inspection features. To solve the problems, it has become desirable and even necessary to combine multi-sensor technology with high precision nanopositioning and nano measuring technology.
Two main methods of contact measurement of steel temperature are applied in industry: with help of disposable and multiple used thermotransducers. Reusable ones are fixed to the bottom of the graphite tip fixed directly on the reinforcement. Then they are able to measure the temperature of the graphite surface. Since it needs to even the graphite temperature and the temperature of the melt metal, the measuring takes some extra time. Therefore the thermotransducer is mounted in the metal for a long time.
This paper is considered the main deformation of cantilever of mechanical type action under the vertical, longitudinal and lateral forces.
This paper is considered and analyzes the modulation mode by scanning the surface of an atomic force microscope based cantilever mechanical type. The developed method for calculating the forces Van der Vals to configure the interaction of bodies.