: pp. 77-83
Hetman Petro Sahaidachnyi National Army Academy
National Technical University “Igor Sikorsky Kyiv Polytechnic Institute”
National Technical University “Igor Sikorsky Kyiv Polytechnic Institute”

The communication system develops in the direction of improvement of communication quality indicators, causing the corresponding complication of products that is not conjugated with the improvement of their reliability. Despite the successes of the technical diagnostics, the correlation between the duration of defect localization and the elimination of the failure (for diagnostics it takes up to 80% of the average recovery time) is observed. Provision the necessary time of restoring the working capacity of communications during their maintenance, ongoing repair and elimination of faulty damage are complicated by the limited forces and means for remote supply bases. The urgency of improving diagnostic support is increased due to the complexity of circuitry of communication technology.

The model of the process of determining the technical condition and the restoration of communication technology, which takes into account the specific features of constructive and circuit construction, is proposed. The scientific novelty lies in the fact that the complex influence of all types of communication technology redundancy on values of their restoration parameters as well as reliability of measuring instruments are taken into account for the first time. Model differs from the known ones since complex approach permits to consider not only the conditions of recovery, but all types of redundancy, inherent in communication technology. We have assessed the quality indicators of diagnostic support that include the probability of correct diagnosis and mathematical expectation of the rejection of the diagnosis from the true value if there exist the specialist error in evaluating the test results. We have also considered the real assumptions and limitations while repairing the mentioned means, expansion of algorithms of single and group defects search.

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