: pp. 17-23
Lviv Polytechnic National University
Lviv Polytechnic National University
Lviv Polytechnic National University
Lviv Polytechnic National University
Technical University, Ilmenau, Germany

The metrological risks of goods production are studied in the work. They are estimated conjugating with the existing technology as well as its metrological support. It is confirmed that in addition to the factors due to the processing of measurement results, the peculiarities of metrological support should be taken into account. One of the characteristic parameters of the metrological instruments is the variance of the measured value. Multiple measurements of the electrical resistance of the mentioned instruments - high-precision resistors designed for indirect measurement of current by measuring the voltage on them, using a DC bridge, were performed. The variance of obtained results is estimated, depending on the number of repeated measurements, the time interval between them, etc.

[1] ISO/IEC Guide 98-4:2012. Uncertainty of measurement – Part 4: Role of measurement uncertainty in conformity assessment. [Online]. Available: https://www.iso. org/ru/standard/50465.html

[2] IATF 16949 : 2016. [Online]. Available: Cj0KCQiAw9qOBhC

[3] D. Montgomery, G. Runger, Applied Statistics and Probability for Engineers, 6th Ed. [Online]. Available:

[4] J.M. Pou, L. Leblond, Smart Metrology: From the metrology of instrumentation to the metrology of decisions, Art. 01007, Jan. 2017, Conf.18th Int. Congress of Metrology, [Online]. Available:

[5] G. Luz, R. Verjan, Smart Sampling for Risk Reduction in Semiconductor Manufacturing. Ecole Nat. Supérieure des Mines de Saint-Etienne, 2014. English. ffNNT : 2014EMSE0747ff. fftel-01126975.

[6] P. Espadinha-Cruz, R. Godina, E. Rodrigues, “A Review of Data Mining Applications in Semiconductor Manufacturing”, Processes, 2021, 9, 305. [Online]. Available:

[7] ISO/IEC 17025:2017, IDT, General requirements for the competence of testing and calibration laboratories. [Online]. Available:

[8] A. Allard, N. Fischer, I. Smith, P. Harris, L. Pendrill, “Risk calculations for conformity assessment in practice”, 19th Int. Congress of Metrology, 16001 (2019), [Online]. Available:

[9] EN ISO/IEC 17025:2017, IDT; General requirements for the competence of testing and calibration laboratories, [Online]. Available:

[10] Z. Kolodiy, B. Stadnyk, A. Kolodiy, S. Yatsyshyn, “Energy Spectrum of Stochastic Signals Caused by Variations of Electrical Resistance”, Automatic Control and Computer Sciences, Vol. 52, No. 4, pp. 311–316, 2018.

[11] M. Mykyichuk, S.Yatsyshyn, B.Stadnyk, Chapter 6, Studies of Metrological Characteristics of Measuring Instruments, in Cyber-Physical Systems and Metrology 4.0. IFSA Publishing, Barcelona, pp.284-325, 2021. [Online]. Available: BOOKSTORE/ Cyber-Physical_Systems_and_ Metrology_4_0.html

[12] Ya. Demirel, V.Gerbaud, Nonequilibrium Thermodynamics, Chapter 1, Fundamentals of Equilibrium Thermodynamics. Elsevier, 2019. [Online]. Available: demirel/978-0-444-64112-0.