Cyber-physical systems as dispersed systems based on interacting networks of physical and computing components provide new functionalities for improving the quality of measurement processes. It is proposed to carry out automated operational setup of metrological parameters of these systems measuring channels during operation basing on the code-controlled measures-imitators. The application of such measures allows the implementation of control systems ensuring the suitability of measuring methods and measuring equipment to intended applications. It is also shown that the operational control of the measuring channels parameters allows ensuring the metrological conformity and reliability of the dispersed cyber-physical systems, since the traditional methods cannot be used here. It demonstrates that construction of passive electric values calibrators disparate of active ones, is associated with fundamental constraints due to the impacts of the switching elements parameters. It is confirmed that the implement of the simulating electric resistance principle for the considered circuits is conjugated simultaneously to the enhancement of discreteness, exactness and reliability, and functionality.
It is proposed to implement the four-clamping measures of electric resistance at the low-voltage reproduction range. Enhancement of the obtained measurements results is achieved by their processing for two polarities of the measuring currents. Ways of designing four-conductor resistance imitators with invariance to their additive errors impacts are considered. It is also suggested and analyzed code-controlled measures of admittance, which can be used for impedance meters’ operative control. The errors analysis envisages that the simulators metrological properties of immittance measures could be determined only by parameters of the applied measures of resistance, capacitance and inductance.
The suggested and analyzed code-controlled measure structures of electrical resistance and complex conductivity on the basis of chip-programmable systems can be implemented in microelectronics. Practical implementation of a universal portable calibrator of active and passive electric values with automatic error correction is considered.
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