растровий електронний мікроскоп (РЕМ)

Purpose. The goal of this work was to develop and study the methods of texture classification of SEM images of micro surfaces of objects based on the statistical and spectral characteristics of texture fragments, as well as a comparative analysis of segmentation methods of SEM images. Methods. The determination of the texture characteristics was based on statistical moments computed by the brightness histogram of a SEM- image or its region. The spectral measures of texture of SEM image were based on properties of the Fourier spectrum.

Purpose. The goal of this work was the development and research of a method of automatically constructing a digital model of the micro surface of an object from SEM stereo pair of digital images taking into account the specifics of the survey SEM and evaluating the accuracy of digital modeling. Methods. The developed method consists, firstly, in generating a dense set of input points in the left SEM image of a stereo pair in regions with local features and using an iterative process in accordance with the levels of the image pyramid.

Purpose. The goal of this work is to establish and study the fractal and metric characteristics of images obtained with scanning electron microscopes (SEM). Methods. This approach is based on the processing of measurements data of digital SEM images of a test object obtained on four types of modern SEM in the magnification range from 1000x to 30000x. Results. The analytical relationship between the increase that was set on the device scale and the “fractal” increase (scale) is established.

Using measurements of digital SEM image of a special test object with a resolution of r = 1425 lin/mm, obtained by SEM JCM-5000 (NeoScope), determined their actual magnification (scale) along the axes x and y-SEM images in the range SEM increases from 1000x to 40000x. Found that large-scale distortion of digital SEM images obtained on this type of SEM does not exceed ± 1 %, regardless of size increase and make the picture.

Purpose. Digital-SEM image, due to various physical factors of scanning electron microscope inherent significant geometric distortion. The aim of this study is to establish and Effective consideration to improve the accuracy to obtain quantitative spatial parameters mikrosurface objects are investigated using SEM. This problem is extremely important, especially nowadays when needed control of technological processes for the production of micron and submicron levels, particularly in engineering, microelectronics and many others.

For measurements of digital SEM images of test grid with a resolution 1425 lin/mm taken on a digital SEM DSM-960A (Carl Zeiss, Germany), are defined by their scale and geometric distortion of the SEM magnification range from 1000h to 20000h. Found that the large-scale distortions of digital SEM images obtained in this type of SEM is systematic, regardless of the increase and is approximately -2 % along the x-axis image and -4 % along the y-axis with a picture.

Purpose. Solids microsurface digital images obtained with scanning electron microscopes (SEM) are characterized by significant geometric distortions, which must be defined and taken into account when determining the quantitative parameters of microsurface solids with high accuracy. Therefore, this problem is so important and urgent, especially during the high-tech quality control of production processes using nanotechnology, particularly in mechanical engineering, aircraft construction, and for creating space and military equipment.

Purpose. It is known that digital images microsurface solids obtained by scanning electron microscopy (SEM) of various types, as characterized by considerable scale and geometric distortion. Therefore, their establishment and accounting is an extremely important task, especially when creating a variety of microdevices with modern nanotechnology. This is a guarantee of reliability, accuracy and efficiency. Methodology.